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TVS Diode Arrays
SCR Diode Array for ESD and Transient Overvoltage Protection
SP724
Peak Transient Current Capability for Long Duration Surges
The peak transient current capability is inversely proportional to the width
of the current pulse. Testing was done to fully evaluate the SP724’s
ability to withstand long duration current pulses using the circuit of
Figure 5. Figure 6 shows the point of overstress as defined by increased
leakage in excess of the data sheet published limits. The safe operating
range of the transient peak current should be limited to no more than
75% of the measured overstress level for any given pulse width as
shown in the curve of Figure 6.
+
V X
-
R 1
(+)
VARIABLETIME DURATION
CURRENT PULSE GENERATOR
CURRENT
SENSE
(-)
+
The test circuit of Figure 5 is shown with a positive pulse input. For a
negative pulse input, the (-) current pulse input goes to an SP724 ‘IN’
input pin and the (+) current pulse input goes to the SP724 V- pin. The
V+ to V- supply of the SP724 must be allowed to float. (i.e., It is not tied
VOLTAGE
PROBE
SP724
C 1
-
to the ground reference of the current pulse generator.)
Note that two input pins of the SP724 may be paralleled to improve
current (and ESD) capability. The sustained peak current capability is
increased to nearly twice that of a single pin.
8
7
6
R 1 ~ 10 ? TYPICAL
V X ADJ. 10V/A TYPICAL
C 1 ~ 100 μ F
FIGURE 5. TYPICAL SP724 PEAK CURRENT TEST CIRCUIT
WITH A VARIABLE PULSE WIDTH INPUT
NOTE: TO ENSURE SAFE OPERATION LIMIT THE
MAXIMUM PEAK CURRENT FOR A GIVEN
PULSE WIDTH TO BE NO GREATER THAN 75%
OF THE VALUES SHOWN.
T A = 25 o C
5
V+ TO V- SUPPLY = 15V
5
4
3
2
1
0
0.001
0.01
0.1
1
10
100
1000
SQUARE WAVE PULSE WIDTH (ms)
FIGURE 6. SP724 TYPICAL NONREPETITIVE PEAK CURRENT PULSE CAPABILITY
w w w. l i t t e l f u s e . c o m
249
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